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Scaning Tunneling Microscopy: Semiconductor surfaces, adsorption and epitaxy

Author(s):
Feenstra. M. R  
Publication title:
Scanning tunneling microscopy and related methods : [proceedings of the NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy, Erice, Italy, April 17-29, 1989]
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
184
Pub. Year:
1990
Page(from):
211
Page(to):
240
Pages:
30
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792308614 [0792308611]
Language:
English
Call no.:
N11482/184
Type:
Conference Proceedings

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