Blank Cover Image

IMPACT IONIZATION FOR ELECTRONS IN SI WITH MONTE CARLO SIMULATION

Author(s):
Thoma R.
Peifer H. J.
Engl W. L.
Quade W.
Brunetti R.
Jacoboni C.
1 more
Publication title:
Granular nanoelectronics
Title of ser.:
NATO ASI series. Series B, Physics
Ser. no.:
251
Pub. Year:
1991
Page(from):
527
Page(to):
530
Pages:
4
Pub. info.:
New York: Plenum Press
ISBN:
9780306438813 [030643881X]
Language:
English
Call no.:
N11479/251
Type:
Conference Proceedings

Similar Items:

Rosini, M., Jacoboni, C., Ossicini, S.

SPIE-The International Society for Optical Engineering

Shu,J.W., Lu,Q., Wong,W.O., Huang,H.C.

SPIE-The International Society for Optical Engineering

2 Conference Proceedings ENSENBLE MONTE CARLO TECHNIQUES

Jacoboni C.

Plenum Press

R. C. Juergens, H. J. Wood

Society of Photo-optical Instrumentation Engineers

Schulte, R.W., Klock, M.C.L, Bashkirov, V., Evseev, I.G., de Assis, J.T., Yevseyeva, O., Lopes, R.T., Li, T., Williams, …

SPIE - The International Society of Optical Engineering

Kingsley,J.R., Harris,D.W.

SPIE-The International Society for Optical Engineering

Amendt,P.A., Estabrook,K.C., Everett,M.J., London,R.A., Maitland,D.J., Zimmerman,G.B., Colston,B.W.,Jr., Silva,L.B.Da, …

SPIE - The International Society for Optical Engineering

Wang, J., Liu, W., Cai, H.

SPIE - The International Society of Optical Engineering

Pricer, T.J., Kushner, M.J., Alkire, R.C.

Electrochemical Society

Offermans, T., Meskers, S. C. J., Janssen, R. A. J.

SPIE - The International Society of Optical Engineering

Floyd C. E., Manglos S. H., Jaszczak R. J., Coleman R. E.

Springer-Verlag

Weiland, L. M., Lada, E. K., Smith, R. C., Leo, D. J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12