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Effects of buffer layer growth conditions on the GaN epilayer quality by MOCVD

Author(s):
Juang,F.-S. ( National Huwei Institute of Technology )
Su,Y.K.
Chang,S.-J.
Chu,T.K.
Chen,C.S.
Chi,L.W.
Lam,K.T.
2 more
Publication title:
Light-emitting diodes : research, manufacturing, and applications IV : 26-27 January 2000, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3938
Pub. Year:
2000
Page(from):
218
Page(to):
223
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435552 [0819435554]
Language:
English
Call no.:
P63600/3938
Type:
Conference Proceedings

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