Blank Cover Image

Optical properties of AIN/sapphire grown at high and low temperatures studied by variable angle spectroscopic ellipsometry and micro Raman scattering

Author(s):
Yan,C.H. ( Univ.of Nebraska/Lincoln )
Yao,H.W.
Abare,A.C.
DenBaars,S.P.
Klaassen,J.J.
Rosamond,M.F.
Chow,P.P.
Zavada,J.M.
3 more
Publication title:
Light-emitting diodes : research, manufacturing, and applications IV : 26-27 January 2000, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3938
Pub. Year:
2000
Page(from):
113
Page(to):
123
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435552 [0819435554]
Language:
English
Call no.:
P63600/3938
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Optical anisotropy of GaN/sapphire studied by generalized ellipsometry and Raman scattering

Yan,C., Yao,H.W., Hove,J.M.Van, Wowchak,A.M., Chow,P.P., Zavada,J.M.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings Variable angle spectroscopic ellipsometry studies of HgI2

Yao, Huade, Johs, Blaine

MRS - Materials Research Society
2 Conference Proceedings Optical Dielectric Response of Gallium Nitride Studied by Variable Angle Spectroscopic Ellipsometry

Yao, H., Yan, C. H., Jenkinson, H. A., Zavada, J. M., Speck, J. S., DenBaars, S. P.

MRS - Materials Research Society
8 Conference Proceedings Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

Lindquist, O. P. A., Arwin, H., Forsberg, U., Bergman, J. P., Jarrendahl, K.

Trans Tech Publications
3 Conference Proceedings Optical Anisotropy Studies of Sapphire by Raman Scattering and Spectroscopic Transmission Ellipsometry

Yao, H., Yan, C. H., DenBaars, S. P., Zavada, J. M.

MRS - Materials Research Society
9 Conference Proceedings AlGaN Schottky diodes for short-wavelength UV applications

Chow,P.P., Klaassen,J.J., Vest,R.E., VanHove,J.M., Wowchak,A.M., Polley,C.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Improved characteristics of InGaN multi-quantum-well laser diodes grown on laterally epitaxially overgrown GaN on sapphire

Hansen, M., Fini, P., Zhao, L., Abare, A., Coldren, L. A., Speck, J. S., DenBaars, S. P.

MRS-Materials Research Society
10 Conference Proceedings Group ?-nitride materials for ultraviolet detection applications

Chow,P.P., Klaassen,J.J., VanHove,J.M., Wowchak,A.M., Polley,C., King,D.

SPIE - The International Society for Optical Engineering
5 Technical Paper Study of InGaAs Based MODEFET Structures Using Variable Angle Spectroscopic Ellipsometry

Alterovitz, S.A., Sieg, R.M., Yao, H.D., Snyder, P.G., Woollam, J.A., Pamulapati, J., Bhattacharya, P.K., Sekula-Moise, …

National Aeronautics and Space Adminstration
11 Conference Proceedings SUPERLATTICE OPTICAL PROPERTIES MEASURED BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY

Snyder, P. G., Merkel, K. G., De, B. N., Woollam, J. A., Langer, D. W., Stutz, C. E., Jones, R., Rai, A. K., Evans, K.

Materials Research Society
6 Conference Proceedings Nondestructive characterization of GaN films grown at low and high temperatures

Yan, C. H., Yao, H. W., Hove, J. M. Van, Wowchak, A. M., Chow, P. P., Han, J., Zavada, J. M.

MRS-Materials Research Society
12 Conference Proceedings Uniformity and Performance Characterization of GaN p-i-n Photodetectors Fabricated From 3-Inch Epitaxy

Hickman, R., II., Klaassen, J. J., Hove, J. M. Van, Wowchak, A. M., Polley, C., Rosamond, M. F., Chow, P. P.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12