Characterization of UV-induced radiation damage to Si-based photodiodes
- Author(s):
- Gupta,R. ( National Institute of Standards and Technology )
- Lykke,K.R.
- Shaw,P.-S.
- Dehmer,J.L.
- Publication title:
- Ultraviolet atmospheric and space remote sensing : methods and instrumentation II : 22 July 1999, Denver, Colorado
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3818
- Pub. Year:
- 1999
- Page(from):
- 27
- Page(to):
- 33
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819433046 [0819433047]
- Language:
- English
- Call no.:
- P63600/3818
- Type:
- Conference Proceedings
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