Characterization of UV-induced radiation damage to Si-based photodiodes

Characterization of UV-induced radiation damage to Si-based photodiodes

Author(s):

Gupta,R. ( National Institute of Standards and Technology )
Lykke,K.R.
Shaw,P.-S.
Dehmer,J.L.

Publication title:

Ultraviolet atmospheric and space remote sensing : methods and instrumentation II : 22 July 1999, Denver, Colorado

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3818

Pub. Year:

1999

Page(from):

27

Page(to):

33

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819433046 [0819433047]

Language:

English

Call no.:

P63600/3818

Type:

Conference Proceedings

Details

TDL ID:	ZA00019940
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Ultraviolet Atmospheric and Space Remote Sensing
Conf. info. (Number):	1999 : 2nd
Conf. info. (Venue):	Denver, CO, USA
Conf. info. (Date):	1999.07.22

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