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Laterally graded multilayer optics for x-ray analysis

Author(s):
Schuster,M.R. ( Siemens AG )
Gobel,H.
Brugemann,L.
Bahr,D.
Burgazy,F.
Michaelsen,C.
Stormer,M.
Ricardo,P.
Dietsch,R.
Holz,T.
Mai,H.
6 more
Publication title:
EUV, x-ray, and neutron optics and sources : 21-23 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3767
Pub. Year:
1999
Page(from):
183
Page(to):
198
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432537 [0819432539]
Language:
English
Call no.:
P63600/3767
Type:
Conference Proceedings

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