Blank Cover Image

Amplitude and phase apodization caused by focusing light through an evanescent gap in SIL recorders

Author(s):
Publication title:
Optical Storage and Optical Information Processing
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4081
Pub. date:
2000
Page(from):
135
Page(to):
142
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437204 [0819437204]
Language:
English
Call no.:
P63600/4081
Type:
Conference Proceedings

Similar Items:

Hirota,K., Milster,T.D., Shimura,K., Zhang,Y., Jo,J.S.

SPIE - The International Society for Optical Engineering

Milster,T.D., Gregg,D.P., Wilson,K.C.

SPIE - The International Society for Optical Engineering

Jo,J.S., Milster,T.D.

SPIE-The International Society for Optical Engineering

Chen, T., Felix, D., Park, S. -K., Hauser, P., McCarthy, B., Sarid, D., Poweleit, C., Menendez, J., Milster, T. D.

SPIE - The International Society of Optical Engineering

Upton,R.S., Akhavan,F., Milster,T.D., Bletscher,W.L., Erwin,J.K., Nicol,A.M., Flores,S.

SPIE - The International Society for Optical Engineering

Upton, R.S., Milster, T.D.

SPIE

J. Zhang, M. Lang, T. D. Milster, T. Chen, E. Aspnes, B. Bell

SPIE - The International Society of Optical Engineering

Akhavan,F., Milster,T.D.

SPIE - The International Society for Optical Engineering

Zhang, Y., Butz, J., Curtis, J.B., Beaudry, N.A., Bletscher, W.L., Erwin, J.K., Knight, D., Milster, T.D., Walker, E.P.

SPIE-The International Society for Optical Engineering

Chang,S., Kim,J.T., Jo,J.H., Lee,S.S.

SPIE-The International Society for Optical Engineering

Shimura,K., Milster,T.D., Hirota,K., Io,J.S.

SPIE - The International Society for Optical Engineering

Milster,T.D.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12