Dielectric characterization of thin films consisting of tin doped indium oxide nanoparticles

Dielectric characterization of thin films consisting of tin doped indium oxide nanoparticles

Author(s):

Publication title:

Nanophase and nanocomposite materials III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

581

Pub. Year:

2000

Page(from):

491

Pub. info.:

Pittsburgh, Pa.: MRS-Materials Research Society

ISSN:

02729172

ISBN:

9781558994898 [1558994890]

Language:

English

Call no.:

M23500/581

Type:

Conference Proceedings

Details

TDL ID:	ZA00019898
Series ID:	PA00000011
Conf. info. (Name):	Nanophase and Nanocomposite Materials : Symposium
Conf. info. (Number):	1999
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1999.11.29-1999.12.02

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