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Characterization of Hot-Electron Effects on Flicker Noise in III-V Nitride Based Heterojunctions

Author(s):
Ho, W. Y.
Fong, W. K.
Surya, C.
Tong, K. Y.
Lu, L. W.
Ge, W. K.
1 more
Publication title:
GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
537
Pub. Year:
1999
Page(from):
G6.4.1
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994430 [1558994432]
Language:
English
Call no.:
M23500/537
Type:
Conference Proceedings

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