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Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs

Author(s):
Lisker, M.
Krtschil, A.
Witte, H.
Christen, J.
As, D. J.
Schottker, B.
Lischka, K.
2 more
Publication title:
GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
537
Pub. date:
1999
Page(from):
G3.14.1
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994430 [1558994432]
Language:
English
Call no.:
M23500/537
Type:
Conference Proceedings

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