Evaluation of the Electromigration Performance of New Aluminum Via Plug-Fill Techniques for 0.25ヲフm and 0.18ヲフm Technologies
- Author(s):
Foley, S. Tung, N. Chan Gounelle, C. Wyborn, G. Louwers, S. Mathewson, A. - Publication title:
- Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 516
- Pub. Year:
- 1998
- Page(from):
- 305
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994225 [155899422X]
- Language:
- English
- Call no.:
- M23500/516
- Type:
- Conference Proceedings
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