Blank Cover Image

Study of the Si/Zns Multilayer System for Optoelectronic applications

Author(s):
Voon, L. C. Lew Yan.  
Publication title:
Materials and devices for silicon-based optoelectronics : symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
486
Pub. Year:
1998
Page(from):
367
Pub. info.:
Warrendale, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993914 [1558993916]
Language:
English
Call no.:
M23500/486
Type:
Conference Proceedings

Similar Items:

Voon, L. C. Lew Yan

MRS - Materials Research Society

C. M. Lew, Y. S. Yan

Elsevier

Voon,L.F.C.Lew Yan, Bolland,P., Laligant,O., Gorria,P., Gremillet,B., Pillet,L.

SPIE-The International Society for Optical Engineering

Aubreton, O., Voon, L.F.L.Y., Lamalle, B., Cathebras, G., Gorria, P., Bellach, B.

SPIE-The International Society for Optical Engineering

Aubreton, O., Voon, L. F. C. Lew Yan, Lamalle, B., Cathebras, G., Moniot, F.

SPIE - The International Society of Optical Engineering

Wang, Q., Hoglund, L., Almqvist, S., Noharet, B., Asplund, C., Malm, H., Petrini, E., Andersson, J. Y., Hammar, M.

SPIE - The International Society of Optical Engineering

Aubreton, O., Lew Yan Voon, L. F. C., Lamalle, B., Sliwa, T., Roy, M., Cathebras, G.

SPIE - The International Society of Optical Engineering

Lamalle,B., Gorria,P., Voon,L.F.C.L.Y., Cathebras,G.

SPIE - The International Society for Optical Engineering

Bellach, B., Lamalle, B., Lew Yan Voon, L.F.C., Thebras, G.

Society of Manufacturing Engineers

Feng,W., Yan,Y., Jin,C., Wu,M., He,Q.

SPIE - The International Society for Optical Engineering

Eldada,L.A., Stengel,K.M.T., Shacklette,L.W., Norwood,R.A., Xu,C., Wu,C., Yardley,J.T.

SPIE-The International Society for Optical Engineering

Jiang,H., An,Z., Zhao,T., Li,C.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12