X-ray Diffraction Analysis of Strain and Mosaic Structure in (001) Oriented Homoepitaxial Diamond Films
- Author(s):
- Publication title:
- III-Nitride, SiC, and Diamond Materials for Electronic Devices : symposium held April, 1996, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 423
- Pub. Year:
- 1996
- Page(from):
- 305
- Pub. info.:
- Pittsburgh, Pa.: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558993266 [1558993266]
- Language:
- English
- Call no.:
- M23500/423
- Type:
- Conference Proceedings
Similar Items:
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
8
Conference Proceedings
Strain and mosaic structure in Si0.7Ge0.3 epilayers grown on Si(001) substrates characterized by high resolution X-ray diffraction
MRS-Materials Research Society |
MRS - Materials Research Society |
American Institute of Chemical Engineers |
4
Conference Proceedings
ELECTROCHEMICAL FORMATION AND SURFACE MODIFICATION OF FREESTANDING HOMOEPITAXIAL DIAMOND FILMS
Electrochemical Society |
Materials Research Society |
5
Conference Proceedings
A New, Nearly Single-Domain Surface Structure of Homoepitaxial Diamond (001) Films
MRS - Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
12
Conference Proceedings
STRUCTURE OF HIGHLY ORIENTED POLYCRYSTALLINE DIAMOND FILMS GROWN ON SI(001)
Electrochemical Society |