IN-SITU, REAL-TIME ANALYSIS OF THE GROWTH OF FERROELECTRIC AND CONDUCTIVE OXIDE HETEROSTRUCTURES BY A NEW TIME-OF-FLIGHT PULSED ION BEAM SURFACE ANALYSIS TECHNIQUE

IN-SITU, REAL-TIME ANALYSIS OF THE GROWTH OF FERROELECTRIC AND CONDUCTIVE OXIDE HETEROSTRUCTURES BY A NEW TIME-OF-FLIGHT PULSED ION BEAM SURFACE ANALYSIS TECHNIQUE

Author(s):

Publication title:

Epitaxial oxide thin films and heterostructures : symposium held April 5-7, 1994, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

341

Pub. Year:

1994

Page(from):

385

Pub. info.:

Pittsburgh, Pa: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992412 [1558992413]

Language:

English

Call no.:

M23500/341

Type:

Conference Proceedings

Details

TDL ID:	ZA00019829
Series ID:	PA00000011
Conf. info. (Name):	Symposium on epitaxial oxide thin films and heterostructures
Conf. info. (Number):	1994
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1994.04.05-1994.04.07

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