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Real-time preparation-free imaging of mobile charge in SiO2

Author(s):
Jastrzebski,L. ( Semiconductor Diagnostics,Inc. )
Edelman,P.
Lagowski,J.J.
Hoff,A.M.
Savchouk,A.
Persson,E.
1 more
Publication title:
Optical characterization techniques for high-performance microelectronic device manufacturing III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2877
Pub. date:
1996
Page(from):
207
Page(to):
217
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422750 [0819422754]
Language:
English
Call no.:
P63600/2877
Type:
Conference Proceedings

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