X-ray photoelectronic spectroscopy on telluride crystal grown in tube with carbon film

X-ray photoelectronic spectroscopy on telluride crystal grown in tube with carbon film

Author(s):

Zhang,S. ( Shanghai Institute of Technical Physics )
Liu,P.
Shen,J.

Publication title:

Infrared Detectors and Focal Plane Arrays IV : 10-11 April 1996, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2746

Pub. Year:

1996

Page(from):

286

Page(to):

289

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421272 [0819421278]

Language:

English

Call no.:

P63600/2746

Type:

Conference Proceedings

Details

TDL ID:	ZA00019796
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Infrared Detectors and Focal Plane Arrays
Conf. info. (Number):	1996 : 4th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1996.04.10-1996.04.11

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