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Use of near-field scanning optical microscopy(NSOM)to characterize optical channel waveguide structures

Author(s):
Naghski,D.H. ( Univ.of Cincinnati )
Lindsay,S.M.
Poweleit,C.D.
Brabander,G.N.De
Subramaniam,V.
Jackson,H.E.
Boyd,J.T.
2 more
Publication title:
Integrated Optics and Microstructures III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2686
Pub. Year:
1996
Page(from):
64
Page(to):
72
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420602 [0819420603]
Language:
English
Call no.:
P63600/2686
Type:
Conference Proceedings

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