Blank Cover Image

Defects spectroscopy in β-Ga2O3

Author(s):
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. date:
1997
Vol.:
Part3
Page(from):
1473
Page(to):
1478
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497898 [0878497897]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Krause-Rehberg,R., Polity,A., Drost,Th., Roos,G., Pensl,G., Volm,D., Meyer,B.K.

Trans Tech Publications

Meyer, B. K., Hofmann, D. M., Christmann, P., Stadler, W., Nikolov, A., Scharmann, A., Hofstaetter, A.

MRS - Materials Research Society

Meyer,B.K., Hofstaetter,A., Baranov,P.G.

Trans Tech Publications

Wetzel, C., Meyer, B.K., Grutzmacher, D., Omling, P.

Materials Research Society

Meyer,B.K.

Trans Tech Publications

Meyer,B.K., Omling,P., Emanuelsson,P.

Trans Tech Publications

Omling,P., Meyer,B.K.

Trans Tech Publications

Stadler,W., Meyer,B.K., Volm,D., Hofmam,D.M., Hoffmann,A., Wiesmann,D., Heitz,R., Kurtz,E., Hommel,D.

Trans Tech Publications

Hofstaetter,A., Meyer,B.K., Scharmann,A., Baranov,P.G., Ilyin,I.V., Mokhov,E.N.

Trans Tech Publications

Meyer,B.K., Wagner,Mt., Dirnstorfer,I., Hofmann,D.M., Karg,F.

Trans Tech Publications

Spaeth, J. -M., Gorger, A., Hofmann, D. M., Meyer, B. K.

Materials Research Society

HOFMANN,D.M., SPAETH,J.-M., MAYER,B.K.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12