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Donor doping of ZnSe:lattice location aud annealing behaviour of implanted boron

Author(s):
Itterrnann,B.
Welker,G.
Kroll,F.
Mai,F.
Marbach,K.
Ackermann,H.
Stockmann,H.-J.
Oldckop,E.
Zeitz,W.-D.
4 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part3
Page(from):
1389
Page(to):
1395
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497898 [0878497897]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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