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ODMR investigations of Ge aeceptors in p-type Al0.4Ga0.6As

Author(s):
Pinheiro,M.V.B.
Krambrook,K.
Chaves,A.S.
Wietzke,K.-H.
Koschnick,F.K.
Spaeth,J.-M.
1 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. date:
1997
Vol.:
Part3
Page(from):
1315
Page(to):
1320
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497898 [0878497897]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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