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CHARACTERIZATION OF ELECTRON TRAPS IN GaAs-GaAlAs SUPERLATTICES.

Author(s):
SILLION,F.
MAUGER,A.
BOURGOIN,J.C.
DEVFAUD,B.
REGRENY,A.
STIEVENARD,D.
1 more
Publication title:
Defects in Semiconductors : Proceedings of the 14th International Conference on Defects in Semiconductors, ICDS-14, Paris, France, August 18-22, 1986
Title of ser.:
Materials science forum
Ser. no.:
10-12
Pub. Year:
1986
Vol.:
Part1
Page(from):
199
Page(to):
204
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878495511 [0878495517]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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