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Design and performance of the 2-ID-B scanning x-ray microscope

Author(s):
McNulty, I. ( Argonne National Laboratory )
Frigo, S.P.
Retsch, C.C.
Wang, Y.
Feng, Y.P.
Qian, Y.
Trakhtenberg, E.
Tieman, B.
Cha, B.-C.
Goetze, K.
Mooney, T.
Haddad, W.S.
7 more
Publication title:
X-ray microfocusing : applications and techniques : 22-23 July 1998, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3449
Pub. Year:
1998
Page(from):
67
Page(to):
74
Pub. info.:
Bellingham, Wash., USA: SPIE
ISSN:
0277786X
ISBN:
9780819429049 [081942904X]
Language:
English
Call no.:
P63600/3449
Type:
Conference Proceedings

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