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Image quality measurement using the Haar wavelet

Author(s):
Publication title:
Wavelet applications in signal and image processing V : 30 July-1 August 1997, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3169
Pub. Year:
1997
Page(from):
127
Page(to):
138
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425911 [0819425915]
Language:
English
Call no.:
P63600/3169
Type:
Conference Proceedings

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