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Determining carrier lifetime using frequency dependence in contactless photoelectromagnetic investigations of GaAs:Te,GaAs:Si,and MQW on GaAs

Author(s):
  • Loncierz,B. ( Silesian Technical Univ.(Poland) )
  • Nowak,M. ( Silesian Technical Univ.(Poland) )
Publication title:
Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3179
Pub. Year:
1997
Page(from):
151
Page(to):
157
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426055 [0819426059]
Language:
English
Call no.:
P63600/3179
Type:
Conference Proceedings

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