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GaAs/AIGaAs complex structures examined by photoreflectance spectroscopy

Author(s):
  • Sek,G. ( Technical Univ.of Wroclaw (Poland) )
  • Misiewicz,J. ( Technical Univ.of Wroclaw (Poland) )
  • Kaniewska,M. ( Institute of Electron Technology (Poland) )
  • Reginski,K. ( Institute of Electron Technology (Poland) )
  • Muszalski,J. ( Institute of Electron Technology (Poland) )
Publication title:
Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3179
Pub. date:
1997
Page(from):
137
Page(to):
140
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426055 [0819426059]
Language:
English
Call no.:
P63600/3179
Type:
Conference Proceedings

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