Blank Cover Image

Photoreflectance spectroscopy for investigations of semiconductor structures (Invited Paper)

Author(s):
Misiewicz,J. ( Technical Univ.of Wroclaw (Poland) )  
Publication title:
Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3179
Pub. date:
1997
Page(from):
110
Page(to):
120
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426055 [0819426059]
Language:
English
Call no.:
P63600/3179
Type:
Conference Proceedings

Similar Items:

Misiewicz,J.

SPIE-The International Society for Optical Engineering

Misiewicz,J., Ciorga,M., Sek,G., Bryja,L., Radziewicz,D., Korbutowicz,R., Panek,M., Tlaczala,M. J.

SPIE-The International Society for Optical Engineering

Sitarek,P., Misiewicz,J., Nauka,K.

SPIE - The International Society for Optical Engineering

Nowaczyk-Utko,M., Sek,G., Misiewicz,J., Sciana,B., Radziewicz,D., Tlaczala,M.J.

SPIE-The International Society for Optical Engineering

Sek,G., Misiewicz,J., Kaniewska,M., Reginski,K., Muszalski,J.

SPIE-The International Society for Optical Engineering

Sek,G., Ryczko,K., Kubisa,M., Misiewicz,J., Koeth,J., Forchel,A.W.B.

SPIE - The International Society for Optical Engineering

J. Misiewicz, K. Jezierski, P. Sitarck, P. Markiewicz, R. Korbutowic

Society of Photo-optical Instrumentation Engineers

Owens, A., Anderson, H., Bavdaz, M., Erd, C., Gagliardi, T., Gostilo, V., Haack, N., Krumrey, M.K., Laemsae, V., Lumb, …

SPIE-The International Society for Optical Engineering

Sitarek,P., Misiewicz,J., Veje,E.

SPIE - The International Society for Optical Engineering

Gonzalez, T., Perez, S., Starikov, E., Shiktorov, P., Gruzinskis, V., Reggiani, L., Varani, L., Vaissiere, J.C.

SPIE-The International Society for Optical Engineering

Sitarek,P., Misiewicz,J., Hansen,O. P.

SPIE-The International Society for Optical Engineering

Matos-Abiague, A., Berakdar, J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12