Critical image formation parameters in thermal hyperspectral image simulations

Critical image formation parameters in thermal hyperspectral image simulations

Author(s):

Brown,S.D. ( Rochester Institute of Technology )
Schott,J.R. ( Rochester Institute of Technology )
Raqueno,R.V. ( Rochester Institute of Technology )

Publication title:

Targets and backgrounds : characterization and representation IV : 13-15 April 1998, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3375

Pub. Year:

1998

Page(from):

313

Page(to):

323

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428240 [0819428248]

Language:

English

Call no.:

P63600/3375

Type:

Conference Proceedings

Details

TDL ID:	ZA00019704
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Targets and Backgrounds
Conf. info. (Number):	1998 : 4th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1998.04.13-1998.04.15

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