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Monte Carlo Simulation for Reliability Physics Modeling and Prediction of Scaled (100NM) Silicon MOSFET Devices

Author(s):
Publication title:
Future trends in microelectronics : reflections on the road to nanotechnology
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
323
Pub. date:
1996
Page(from):
227
Page(to):
236
Pages:
10
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9780792341697 [0792341694]
Language:
English
Call no.:
N11482/323
Type:
Conference Proceedings

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