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X-ray evolving universe spectroscopy mission(XEUS):narrow-field imaging high-resolution spectrometer:II(1 to 10 keV)

Author(s):
Korte,P.A.J.de ( Space Research Organization Netherlands )
Hoevers,H.F.C.
Bruijn,M.P.
Bento,A.C.
Mels,W.A.
Bleeker,J.A.M.
Holland,A.D.
Turner,M.J.T.
3 more
Publication title:
X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3766
Pub. Year:
1999
Page(from):
152
Page(to):
161
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432520 [0819432520]
Language:
English
Call no.:
P63600/3766
Type:
Conference Proceedings

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