Blank Cover Image

Characteristic extraction of face using DWT and recognition based on neural networks

Author(s):
Publication title:
Input/Output and Imaging Technolgies II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4080
Pub. Year:
2000
Page(from):
180
Page(to):
191
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437198 [0819437190]
Language:
English
Call no.:
P63600/4080
Type:
Conference Proceedings

Similar Items:

Yoon S. H., Park G., Hur G. T., Kim J. H.

SPIE - The International Society of Optical Engineering

M. C. Kim, J. H. Kim, S. K. Park, T. S. Yoon

Society of Photo-optical Instrumentation Engineers

B. Javidi, J. Li

Society of Photo-optical Instrumentation Engineers

Kim, S., Lim, S., Cha, H., Hahn, H.

SPIE - The International Society of Optical Engineering

J. H. Kim, J. G. Park, C. Lee

Society of Photo-optical Instrumentation Engineers

C.S. Lee, J.H. Chung

Society of Photo-optical Instrumentation Engineers

U.M.S. Altaf, C.H. Dagli

Society of Photo-optical Instrumentation Engineers

Lee,Y., Lim,S.-C., Park,D.-S.

SPIE-The International Society for Optical Engineering

Jeon, K.-A., Kim, H.-H., Yoo, J.-Y., Park, J.-T., Oh, H.-K.

SPIE-The International Society for Optical Engineering

S.K. Rogers, J.M. Colombi, C.E. Martin, J.C. Gainey, Jr., K.H. Fielding

Society of Photo-optical Instrumentation Engineers

Eide,A.J., Jahren,C., Jorgensen,S., Lindblad,T., Lindsey,C.S., Osterud,K.

SPIE-The International Society for Optical Engineering

Kim,E.-S., Cha,J.-W., Ryu,C.-S.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12