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Effective Bayesian inference by data-driven Markov chain Monte Carlo for object recognition and image segmentation

Author(s):
Publication title:
Automatic target recognition X : 26-28 April 2000, Orlando, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4050
Pub. Year:
2000
Page(from):
320
Page(to):
332
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436764 [0819436763]
Language:
English
Call no.:
P63600/4050
Type:
Conference Proceedings

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