Application of the thermal line scanner to quantify material loss due to corrosion
- Author(s):
- Cramer,K.E. ( NASA Langley Research Ctr. )
- Winfree,W.P.
- Publication title:
- Thermosense XXII: 25-27 April 2000, Orlando, Florida
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4020
- Pub. Year:
- 2000
- Page(from):
- 210
- Page(to):
- 219
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436467 [0819436461]
- Language:
- English
- Call no.:
- P63600/4020
- Type:
- Conference Proceedings
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