Blank Cover Image

Determining and reducing the overhead losses in an ASIC-type environment

Author(s):
Ames,D.B. ( IBM Microelectronics Div. )  
Publication title:
Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4000
Pub. Year:
2000
Vol.:
Part2
Page(from):
892
Page(to):
895
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436184 [0819436186]
Language:
English
Call no.:
P63600/4000
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Computer loss experience and predictions

Parker,D.B.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Reduce the Leakage Current of High Voltage Polymer Ta Electrolyte Capacitors

D.B. Tian, Q.F. Pan, X.Z. He, X.H. Zhang

Trans Tech Publications
2 Conference Proceedings Optical techniques for determining dynamic material properties

Paisley,D.L., Stahl,D.B.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Effect of Environment on Genetic Stability and Protein Excretion in E. coli

SHULER, M.L., CHALMERS, J.J., GEORGIOU, G., TOGNA, A.P., WILSON, D.B.

American Institute of Chemical Engineers
3 Conference Proceedings Navigating mazes in a virtual environment

Browse, R.A., Skillicorn, D.B., Middleman, D.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Evaluating three types of artificial neural networks for classifying vehicles with multisensor data

Crocoll,W.M., Ellis,N.C., Simmons,D.B.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Structure controlling in molecular heterophase systems:reaction of the key-lock type

Mintz,R.I., Berg,D.B.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Optics demonstrations with an overhead projector

D.S. Goodman

Society of Photo-optical Instrumentation Engineers
5 Conference Proceedings Feasibility of SiC Threshold Voltage Drift Characterization for Reliability Assessment in Production Environments

D.B. Habersat, R. Green, A.J. Lelis

Trans Tech Publications
11 Conference Proceedings Optical measurements on overhead optical fiber cables for stresses and damage identification

Ravet,F., Heens,B., Daniaux,D., Froidure,J.-C., Blondel,M., Dascotte,M., Lots,P.

SPIE - The International Society for Optical Engineering
6 Conference Proceedings Time-varying environment-based machine learning technique for autonomous agent shortest-path planning

Megherbi,D.B., Teirelbar,A., Boulenouar,A.J.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Microstructure and Oxidation of Al/BN Composites Fabricated by the Pressureless Infiltration Method

Lee, D.B.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12