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Structural characterization and raman studies of SrBi2Ta0.8Nb1.2O9 thin films

Author(s):
Srinivas, S.
Das, R. R.
Mercoda, J.
Fachini, E. R.
Perez, W.
Katiyar, R. S.
1 more
Publication title:
Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
596
Pub. Year:
2000
Page(from):
191
Pub. info.:
Warrendale, PA: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558995048 [1558995048]
Language:
English
Call no.:
M23500/596
Type:
Conference Proceedings

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