Analysis of Cr-doped CdGeAs2 using thermal admittance spectroscopy
- Author(s):
Smith, S. R. Evwaraye, A. O. Ohmer, M. C. Saxler, A. W. Goldstein, J. T. Solomon, J. Schunemann, P. G. Pollak, T. M. - Publication title:
- Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 607
- Pub. Year:
- 2000
- Page(from):
- 465
- Pub. info.:
- Warrendale, Pa.: MRS-Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558995154 [1558995153]
- Language:
- English
- Call no.:
- M23500/607
- Type:
- Conference Proceedings
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