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Analysis of Cr-doped CdGeAs2 using thermal admittance spectroscopy

Author(s):
Smith, S. R.
Evwaraye, A. O.
Ohmer, M. C.
Saxler, A. W.
Goldstein, J. T.
Solomon, J.
Schunemann, P. G.
Pollak, T. M.
3 more
Publication title:
Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
607
Pub. date:
2000
Page(from):
465
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558995154 [1558995153]
Language:
English
Call no.:
M23500/607
Type:
Conference Proceedings

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