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Native defect characterization in ZnGeP2

Author(s):
Hoffmann, A.
Born, H.
Naser, A.
Gehlhoff, W.
Maffetone, J.
Perlov, D.
Ruderman, W.
Zwieback, I.
Dietz, N.
Bachmann, K. J.
5 more
Publication title:
Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
607
Pub. Year:
2000
Page(from):
373
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558995154 [1558995153]
Language:
English
Call no.:
M23500/607
Type:
Conference Proceedings

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