X-RAY STUDIES OF LOW-TEMPERATURE GROWN SiO2 ON Si
- Author(s):
- Publication title:
- Interface control of electrical, chemical, and mechanical properties : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 318
- Pub. Year:
- 1994
- Page(from):
- 75
- Pub. info.:
- Pittsburgh: MRS - Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558992177 [1558992170]
- Language:
- English
- Call no.:
- M23500/318
- Type:
- Conference Proceedings
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