Blank Cover Image

Analytical Methodology and Design of Advanced Test Structure for the Mechanical Characteristics of Microactuator Materials

Author(s):
Publication title:
Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
563
Pub. Year:
1999
Page(from):
237
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994706 [155899470X]
Language:
English
Call no.:
M23500/563
Type:
Conference Proceedings

Similar Items:

Lee,S.-H., Pak,Y., Kwon,D.

SPIE - The International Society for Optical Engineering

Ree, M., Goh, W. H., Park, J. -W., Lee, M. -H., Rhee, S. B.

MRS - Materials Research Society

Park, H.-H., Kwon, K.H., Koak, B.-H., Lee, S.-M., Kwon, O-J., Kim, B.-W., Lee, J.-W., Yoo, J.-B., Sung, Y.-K.

Materials Research Society

J.S. Lee, K.H. Kim, J.H. Han, D.I. Kwon

Trans Tech Publications

Kim, D., Kim, J., Ha, S.-W., Cho, H., Lee, S.-K., Pak, J.J.

SPIE - The International Society of Optical Engineering

Kwon, C.W., Baure, G., Lee, G., Chaniran, F., Sun, D., Perepichka, D., Kim, C.-J., Tolbert, S., WudI, F., Dunn, B.

Electrochemical Society

Kim, B., Kim, B.M., Ryu, J.J., Oh, I.-H., Lee, S.-K., Cha, S.-E., Pak, J.

SPIE-The International Society for Optical Engineering

Jung,S., Jeon,J.U., Pak,Y.E., Lee,S.

SPIE - The International Society for Optical Engineering

Son, J. H., Chang, J. -H., Kim, D. B., Lee, S. -K., Pak, J. J.

SPIE - The International Society of Optical Engineering

B.S. Jang, C.H. Lee, J.W. Choi, J.S. Kwon, H.K. Kim, C.H. Park, H.M. Kim

Trans Tech Publications

I. W. Kwon, J. E. Kim, C. H. Hwang, T. S. Kim, Y. S. Lee, H. C. Lee

SPIE - The International Society of Optical Engineering

Lee, M.-W., Choi, C.-H., Jo, S.-B., O, B.-H., Lee, S.-G., Park, S.-G., Lee, E.-H.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12