Hoover, J. M., Henry, R. A., Lindsay, G. A., Nadler, M. P., Nee, S. F., Seltzer, M. D., Stenger-Smith, J. D.
American Chemical Society
|
Martynski, T., Biadasz, A., Hertmanowski, R., Bauman, D.
SPIE - The International Society of Optical Engineering
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Benferhat, R., Drevillon, B., Robin, P.
Materials Research Society
|
Bodammer,G., Gourlay,J., Vass,D.G., Hossack,W.J.
SPIE-The International Society for Optical Engineering
|
Li, S., Ma, S., Wang, W., Wang, G., Meng, X., Sun, J., Chu, J.
SPIE - The International Society of Optical Engineering
|
Lee, Sukmock, Dutcher, J. R., Hillerbrands, B., Stegeman, G. I., Knoll, W., Duda, G., Wegner, G., Nizzoli, F.
Materials Research Society
|
Fanucci E. G., Nixon M. C., Petruska A. M., Seip T. C., Talham R. D., Granroth E. G., Meisel W. M.
Kluwer Academic Publishers
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Nichols J. R.
Kluwer Academic Publishers
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Viswanathan, Ravi, Schwartz, D. K., Madsen, L. L., Zasadzinski, J. A.
MRS - Materials Research Society
|
Ahn, Dong June, Franses, Elias I.
American Chemical Society
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Ledoux I., Josse D., Zyss J., McLean T., Hahn A. R., Gordon P. F., Allen S., Lupo D., Prass W., Scheunemann U., …
Kluwer Academic Publishers
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Wrobel,D., Goc,J., Planner,A., Hara,M., Miyake,J.
SPIE-The International Society for Optical Engineering
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