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Hot-Carrier Effect in Submicron pMOSFETs

Author(s):
Saha, S.
Yeh, C. S.
Lindorfer, Ph.
Luo, J.
Nellore, U.
Gadepally, B.
1 more
Publication title:
Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
391
Pub. date:
1995
Page(from):
21
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992948 [1558992944]
Language:
English
Call no.:
M23500/391
Type:
Conference Proceedings

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