Blank Cover Image

Hot Carrier Degradation of Gain in Bipolar Transistors

Author(s):
Publication title:
Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
391
Pub. date:
1995
Page(from):
11
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992948 [1558992944]
Language:
English
Call no.:
M23500/391
Type:
Conference Proceedings

Similar Items:

Chang, Y.S., Li, S.S., Cristoloveanu, S.

Electrochemical Society

Pan, N., Welser, R.E., Lutz, C.R., Elliot, J., Vu, D.P.

Electrochemical Society

Brady, F.T., Sinha, S.P., Haddad, N.F., Ioannou, D.E.

Electrochemical Society

Linn,J.H., Shlepr,M.G., McNamara,J.M., Choma,R.F., Yates,P.D.

SPIE - The International Society for Optical Engineering

Sinha, S P, Ii, F D, loonnou, D E, Jenkins, W C, Hughes, H L, Lin, M S

Electrochemical Society

Yuki Watabe, Taku Tajima, Tohru Nakamura

Materials Research Society

Ted A. Laurence, Jeff D. Bude, Nan Shen

Materials Research Society

Topkar,A., Mathew,T., Lal,R., Vasi,J., Nanver,L.

Narosa Publishing House

Q.J. Zhang, C. Jonas, A.A. Burk, C. Capell, J. Young

Trans Tech Publications

Kizilyalli,I.C., Abein,G., Chen,Z., Weber,G.R., Register,F., Harris,E., Chetlur,S., Higashi,G.S., Schofieled,M., Sen,S., …

SPIE-The International Society for Optical Engineering

Monier, C., Pearton, S.J., Baca, Albert G., Chang, P.C., Zhang, L., Han, J., Shul, R.J., Ren, F., LaRoche, J.

Materials Research Society

So, D.S., Wang, J.J., Yang, C.T., Chen, D.H, Theng, H.C., Chen, H., Lee, S.Y.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12