CONTROL OF POINT DEFECTS IN SEMICONDUCTORS

CONTROL OF POINT DEFECTS IN SEMICONDUCTORS

Author(s):

Publication title:

Microstructure of irradiated materials : Symposium held November 29-1 December, 1994, Boston, Massachusetts USA

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

373

Pub. Year:

1995

Page(from):

529

Pub. info.:

Pittsburgh, Pa: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992757 [1558992758]

Language:

English

Call no.:

M23500/373

Type:

Conference Proceedings

Details

TDL ID:	ZA00019369
Series ID:	PA00000011
Conf. info. (Name):	Symposium on microstructure of irradiated materials
Conf. info. (Number):	1994
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1994.11.29-1994.12.01

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