Blank Cover Image

Defect detection in apples by means of x-ray imaging

Author(s):
Schatzki,T.F. ( USDA Agricultural Research Service )
Haff,R.P.
Young,R.
Can,I.
Le,L.C.
Toyofuku,N.
1 more
Publication title:
Optics in Agriculture, Forestry, and Biological Processing II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2907
Pub. Year:
1996
Page(from):
176
Page(to):
185
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819423092 [0819423092]
Language:
English
Call no.:
P63600/2907
Type:
Conference Proceedings

Similar Items:

T.F. Schatzki, R. Young, R.P. Haff, J. Eye, G. Wright

Society of Photo-optical Instrumentation Engineers

Shimao, D., Sugiyama, H., Kunisada, T., Maksimenko, A., Toyofuku, F., Ueno, E., Yamasaki, K., Obayashi, C., Hyodo, K., …

SPIE - The International Society of Optical Engineering

Keagy,P.M., Schatzki,T.F., Le,L.C., Casasent,D.P., Weber,D.

SPIE-The International Society for Optical Engineering

Schwenker,R.P., Jeromin,L.S., Lee,D.L., Williams,C.L.

SPIE-The International Society for Optical Engineering

Casasent,D.P., Sipe,M.A., Schatzki,T.F., Keagy,P.M., Le,L.C.

SPIE-The International Society for Optical Engineering

Cilesiz, I.F., Fockens, P., Kerindongo, R.P., Faber, D.J., Tytgat, G.N., ten Kate, F., van Leeuwen, T.G.

SPIE-The International Society for Optical Engineering

P.M. Keagy, B. Parvin, T.F. Schatzki

Society of Photo-optical Instrumentation Engineers

Barbour, R.L., Graber, H.L., Pei, Y., Schmitz, C.H., Xu, Y., Di Martino, A., Castellanos, F.X., Klemer, D.P., Hardin, …

SPIE - The International Society of Optical Engineering

Talukder,A., Casasent,D.P., Lee,H.-W., Keagy,P.M., Schatzki,T.F.

SPIE - The International Society for Optical Engineering

Talukder,A., Casasent,D.P., Lee,H.-W., Keagy,P.M., Schatzki,T.F.

SPIE - The International Society for Optical Engineering

6 Conference Proceedings Detection of insect damage in almonds

Kim,S., Schatzki,T.F.

SPIE - The International Society for Optical Engineering

DiPietro, R.C., Perry, R.P., Fante, R.L.

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12