Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy

Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy

Author(s):

Tsai,D.P. ( National Chung Cheng Univ. )
Chung,Y.L.
Othonos,A.

Publication title:

Functional Photonic and Fiber Devices

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2695

Pub. Year:

1996

Page(from):

204

Page(to):

210

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420695 [0819420697]

Language:

English

Call no.:

P63600/2695

Type:

Conference Proceedings

Details

TDL ID:	ZA00019328
Series ID:	PA00000029
Conf. info. (Name):	Photonics West : Functional Photonic and Fiber Devices
Conf. info. (Number):	1996
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1996.01.30-1996.02.01

Similar Items:

1 Conference Proceedings Subwavelength imaging of an etched fiber with an intracore Bragg grating by apertured photon scanning tunneling microscope D.P. Tsai, Y.L. Chung, A. Othonos Society of Photo-optical Instrumentation Engineers	7 Conference Proceedings Far-field nonlinear optical absorption in AgOx superresolution near-field structure Ho,F.H., Lin,W.Y., Tsai,D.P. SPIE-The International Society for Optical Engineering
2 Conference Proceedings Short fiber probs scheme for tapping-mode tuning fork near-field scanning optical microscopy Huang, C.W., Lu, N.H., Chen, C.Y., Yu, C.F., Kao, T.S., Tsai, D.P., Wang, P. SPIE-The International Society for Optical Engineering	8 Conference Proceedings Scanning near-field optical/atomic-force microscopy for biomedical applications Tamiya,E., Iwabuchi,S., Murakami,Y., Sakaguchi,T., Yokoyama,K., Chiba,N., Muramatsu,H. SPIE-The International Society for Optical Engineering
3 Conference Proceedings Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes Taylor,R.S., Leopold,K.E., Wendman,M.A., Gurley,G., Elings,V. SPIE-The International Society for Optical Engineering	9 Conference Proceedings Atomic force and near-field scanning microscopy of solid zFP538 films Zubova, N.N., Astafyev, A.A., Petrukhin, A.N., Sarkisov, O.M., Savitsky, A.P. SPIE - The International Society of Optical Engineering
4 Conference Proceedings Ultrahigh-density optical recording using a scanning near-field optical microscope Lu,Y.Y., Tsai,D.P., Guo,W.R., Chen,S.-C., Liu,J.R., Shieh,H.P.D. SPIE-The International Society for Optical Engineering	10 Conference Proceedings Micromachined aperture probe for combined atomic force and near-field scanning optical microscopy (AFM/NSOM) Drews,D., Noell,W., Ehrfeld,W., Lacher,M., Mayr,K., Marti,O., Serwatzy,C., Abraham,M. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope Yang,C.W., Tsai,D.P., Jackson,H.E. SPIE - The International Society for Optical Engineering	11 Conference Proceedings WD25:Mechanism of the superresolution optical near-field structure Tsai,D.P., Ho,F.H., Yang,C.W., Gu,M., Ke,P.C. SPIE - The International Society for Optical Engineering
6 Conference Proceedings Practical Realization of Apertureless Scanning Near-field Optical Microscopy Using Hybrid Mode Atomic Force Microscopy Sergey Zayats, John Alexander, Sergei Magonov, Dmitry Kazantsev Materials Research Society	12 Conference Proceedings Study of the mechanism of the light-scattering-mode superresolution near-field structure Lin,W.C., Su,J.D., Tsai,M.C., Tsai,D.P., Lu,N.H., Huang,H.J., Lin,W.Y. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12