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Defect control in As-rich GaAs

Author(s):
Specht,P.
Jeong,S.
Sohn,H.
Luysberg,M.
Prasad,A.
Gebauer,J.
Krausse-Rehberg,R.
Weber,E.R.
3 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part2
Page(from):
951
Page(to):
956
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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