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Perturbed angular correlation measurements and lattice site location of Br in GaAs

Author(s):
Wehner,M.
Risse,M.
Vianden,R.
Dalmer,M.
Hofsass,H.
Ridgway,M.C.
Petravic,M.
Collaboration,the ISOLDE
3 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part2
Page(from):
899
Page(to):
904
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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