Site stability,diffusion and charge dynamics for muonium in GaAs
- Author(s):
Estle,T.L. Chow,K.H. Cox,S.F.J. Davis,E.A. Hitti,B. Kiefl,R.F. Lichti,R.L. Schwab,C. - Publication title:
- Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
- Title of ser.:
- Materials science forum
- Ser. no.:
- 258-263
- Pub. Year:
- 1997
- Vol.:
- Part2
- Page(from):
- 849
- Page(to):
- 854
- Pub. info.:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878497881 [0878497889]
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
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