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Investigation of ion-implanted boron in diamond

Author(s):
Bharuth-Ram,K.
Ittennann,B.
Metzner,H.
Fullgrabe,M.
Heemeier,M.
Kroll,F.
Mai,F.
Matbach,K.
Meier,P.
Peters,D.
Thiess,H.
Ackermann,H.
Selischop,J.P.F.
Stockmann,H.-J.
Uhrmacher,M.
10 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part2
Page(from):
763
Page(to):
768
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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