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Optical absorption and Zeeman study of the 6H SiC:Cr

Author(s):
Dornen,A.
Kaufmann,B.
Baur,J.
Kunzer,M.
Kaufmann,U.
Baranov,P.G.
1 more
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. date:
1997
Vol.:
Part2
Page(from):
697
Page(to):
702
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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